Revealing extended defects in HVPE-grown GaN

Journal of Crystal Growth 2010 Vol. 312; Iss. 18

Revealing extended defects in HVPE-grown GaN

J.L. Weyher, B. łucznik, I. Grzegory, J. Smalc-Koziorowska, T. Paskova
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Volume:
312
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2010.04.021
File:
PDF, 944 KB
english, 2010
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