Auger electron spectroscopy and X-ray diffraction studies...

Radiation Effects and Defects in Solids 1990 / 05 Vol. 114; Iss. 1-2

Auger electron spectroscopy and X-ray diffraction studies of Ti-Si layers synthesised by ion implantation

Vidwans, S. V., Narsale, A. M., Salvi, V. P., Rangwala, A. A., Guzman, L., Marchetti, F., Dapor, M., Calliari, L.
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Volume:
114
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159008213086
Date:
May, 1990
File:
PDF, 263 KB
english, 1990
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