Dislocation dynamics and slip band formation in silicon:...

Journal of Crystal Growth 2011 Vol. 318; Iss. 1

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

A.N. Danilewsky, J. Wittge, A. Croell, D. Allen, P. McNally, P. Vagovič, T. dos Santos Rolo, Z. Li, T. Baumbach, E. Gorostegui-Colinas, J. Garagorri, M.R. Elizalde, M.C. Fossati, D.K. Bowen, B.K. Tann
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Volume:
318
Year:
2011
Language:
english
Pages:
7
DOI:
10.1016/j.jcrysgro.2010.10.199
File:
PDF, 1.21 MB
english, 2011
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