Electrical properties of top-gate oxide thin-film...

Journal of Crystal Growth 2011 Vol. 326; Iss. 1

Electrical properties of top-gate oxide thin-film transistors with double-channel layers

Woo-Seok Cheong, Sung Mook Chung, Jae-Hun Shin, Chi-Sun Hwang
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Volume:
326
Year:
2011
Language:
english
Pages:
5
DOI:
10.1016/j.jcrysgro.2011.01.094
File:
PDF, 1.06 MB
english, 2011
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