Inference About Defects in the Presence of Masking

Technometrics 1996 / 08 Vol. 38; Iss. 3

Inference About Defects in the Presence of Masking

Flehinger, Betty J., Reiser, Benjamin, Yashchin, Emmanuel
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Volume:
38
Language:
english
Journal:
Technometrics
DOI:
10.1080/00401706.1996.10484504
Date:
August, 1996
File:
PDF, 897 KB
english, 1996
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