Defect-Centric Distribution of Channel Hot Carrier...

IEEE Electron Device Letters 2014 / 12 Vol. 35; Iss. 12

Defect-Centric Distribution of Channel Hot Carrier Degradation in Nano-MOSFETs

Procel, Luis Miguel, Crupi, Felice, Franco, Jacopo, Trojman, Lionel, Kaczer, Ben
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2014.2361342
Date:
December, 2014
File:
PDF, 454 KB
english, 2014
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