Analytical modeling of cutoff frequency variability...

Solid-State Electronics 2015 / 03 Vol. 105

Analytical modeling of cutoff frequency variability reserving correlations due to random dopant fluctuation in nanometer MOSFETs

Lü, Wei-feng, Wang, Guang-yi, Sun, Ling-ling
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Volume:
105
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2014.12.024
Date:
March, 2015
File:
PDF, 807 KB
english, 2015
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