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Validating forecasts of the joint probability density of bond yields: Can affine models beat random walk?
Alexei V. Egorov, Yongmiao Hong, Haitao LiVolume:
135
Year:
2006
Language:
english
Pages:
30
DOI:
10.1016/j.jeconom.2005.07.018
File:
PDF, 420 KB
english, 2006