Nanoscale capacitance spectroscopy characterization of...

Nanoscale capacitance spectroscopy characterization of AlGaN/GaN heterostructure by current-sensing atomic force microscopy

H. Zeng, H. Sun, W. Luo, W. Huang, Z. Wang, Y. Li
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Volume:
105
Year:
2009
Language:
english
DOI:
10.1063/1.3109209
File:
PDF, 707 KB
english, 2009
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