VVandVO2defects in silicon studied with hybrid density...

Journal of Materials Science: Materials in Electronics 2015 / 3 Vol. 26; Iss. 3

VVandVO2defects in silicon studied with hybrid density functional theory

Christopoulos, S.-R. G., Wang, H., Chroneos, A., Londos, C. A., Sgourou, E. N., Schwingenschlögl, U.
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Volume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-014-2576-9
Date:
March, 2015
File:
PDF, 490 KB
english, 2015
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