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Square-wave thin-film voltammetry: influence of uncompensated resistance and charge transfer kinetics
Valentin Mirčeski, Rubin Gulaboski, Fritz ScholzVolume:
566
Year:
2004
Language:
english
Pages:
10
DOI:
10.1016/j.jelechem.2003.11.046
File:
PDF, 466 KB
english, 2004