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A multi-length-scale USAXS/SAXS facility: 10–50 keV small-angle X-ray scattering instrument
Freelon, Byron, Suthar, Kamlesh, Ilavsky, JanVolume:
46
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/s0021889813021900
Date:
October, 2013
File:
PDF, 632 KB
english, 2013