Freeform surface measurement and characterisation using a...

Journal of Physics Conference Series 2014 / 03 Vol. 483

Freeform surface measurement and characterisation using a toolmakers microscope

Wong, Francis Seung-yin, Chauh, Kong-Bieng, Venuvinod, Patri K
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Volume:
483
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/483/1/012004
Date:
March, 2014
File:
PDF, 441 KB
english, 2014
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