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Effect of silicon nitride layers on the minority carrier diffusion length in c-Si wafers
J. Toušek, J. Toušková, A. Poruba, P. Hlídek, J. LörinčíkVolume:
100
Year:
2006
Language:
english
DOI:
10.1063/1.2390628
File:
PDF, 384 KB
english, 2006