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Dielectric and X-ray Diffraction Analysis of Ba(Ga,Ta) 0.05 Ti 0.90 O 3
Mion, Thomas, Potrepka, D. M., Crowne, F. J., Tauber, A., Tidrow, Steven C.Volume:
473
Language:
english
Journal:
Ferroelectrics
DOI:
10.1080/00150193.2014.974431
Date:
December, 2014
File:
PDF, 698 KB
english, 2014