[IEEE 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (3-7 Feb. 2002)] 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315) - Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuits
Badaroglu, M., van Heijningen, M., Gravot, V., Compiet, J., Donnay, S., Engels, M., Gielen, G., De Man, H.Volume:
1
Year:
2002
Language:
english
DOI:
10.1109/isscc.2002.993042
File:
PDF, 1.05 MB
english, 2002