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[IEEE 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC) - Playa del Carmen, Mexico (2014.10.6-2014.10.8)] 2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC) - Reducing test time for 3D-ICs by improved utilization of test elevators
Muthyala, Sreenivaas S., Touba, Nur A.Year:
2014
Language:
english
DOI:
10.1109/VLSI-SoC.2014.7004157
File:
PDF, 156 KB
english, 2014