![](/img/cover-not-exists.png)
Measurements of the surface resistance and conductivity of thin conductive films at frequency about 1 GHz employing dielectric resonator technique
Jerzy Krupka, Krzysztof Derzakowski, Tomasz Zychowicz, Bradley L. Givot, William C. Egbert, M.M. DavidVolume:
27
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.jeurceramsoc.2006.11.008
File:
PDF, 453 KB
english, 2007