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Multi-chamber Ultrahigh Vacuum Scanning Tunneling Microscope System for Investigating Processed GaAs Surfaces and Observation of Argon-Ion-Bombarded GaAs Surfaces
Tanaka, Ichiro, Ohkouchi, ShunsukeVolume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.2152
Date:
May, 1993
File:
PDF, 2.24 MB
1993