X-ray characterization of GaN and related materials at...

IOP Conference Series Materials Science and Engineering 2011 / 09 Vol. 24

X-ray characterization of GaN and related materials at growth temperatures–system design and measurements

Takeda, Yoshikazu, Ninoi, Koji, Ju, Guangxu, Kamiya, Hajime, Mizuno, Tetsuya, Fuchi, Shingo, Tabuchi, Masao
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Volume:
24
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/24/1/012002
Date:
September, 2011
File:
PDF, 1002 KB
english, 2011
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