Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Martin Schloffer, Christian Teichert, Peter Supancic, Andrei Andreev, Yue Hou, Zhonghua WangVolume:
30
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.jeurceramsoc.2010.01.005
File:
PDF, 394 KB
english, 2010