Electromechanical Displacement Detection With an On-Chip High Electron Mobility Transistor Amplifier
Oda, Yasuhiko, Onomitsu, Koji, Kometani, Reo, Warisawa, Shin-ichi, Ishihara, Sunao, Yamaguchi, HiroshiVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.06GJ01
Date:
June, 2011
File:
PDF, 527 KB
english, 2011