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Variations in Nanometer CMOS Flip-Flops: Part II—Energy Variability and Impact of Other Sources of Variations
Alioto, Massimo, Consoli, Elio, Palumbo, GaetanoVolume:
62
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2014.2366813
Date:
March, 2015
File:
PDF, 1.67 MB
english, 2015