Critical Layer Thickness of $\bf n\mbox{-}In_{0.52}Al_{0.48}As/In_{0.8}Ga_{0.2}As/In_{0.52}Al_{0.48}As$ Pseudomorphic Heterostructures Studied by Photoluminescence
Ueno, Yoshiki, Taguchi, Takashi, Matsugatani, Kazuoki, Takeuchi, Yukihiro, Sugiyama, Yoshinobu, Tacano, Munecazu, Hattori, TadashiVolume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.L162
Date:
February, 1994
File:
PDF, 500 KB
1994