[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October...

  • Main
  • [ECS 214th ECS Meeting - Honolulu, HI...

[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Ellipsometric Porosimetry: Fast and Non Destructive Technique for Characterization of Porous Low-K; Highlights on Plasma Damage and Water Effect on Treated Materials

Bourgeois, Alexis, Bondaz, Alexis, Kitzinger, Laurent, Defranoux, Christophe
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
16
Year:
2008
Language:
english
DOI:
10.1149/1.2982559
File:
PDF, 1.52 MB
english, 2008
Conversion to is in progress
Conversion to is failed