Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy
Zaoli Zhang, Wilfried Sigle, Christoph T. Koch, Manfred RühleVolume:
31
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.jeurceramsoc.2011.03.016
File:
PDF, 690 KB
english, 2011