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Field Ion-Scanning Tunneling Microscopy of Metallofullerenes Adsorbed on the Si(100)2×1 Surface
Wang, Xiang-Dong, Hashizume, Tomihiro, Xue, Qikun, Shinohara, Hisanori, Saito, Yahachi, Nishina, Yuichiro, Sakurai, ToshioVolume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L866
Date:
June, 1993
File:
PDF, 952 KB
1993