Dynamical Formation Process of Pure Edge Misfit Dislocations at GaAs/Si Interfaces in Post-Annealing
Asai, Koyu, Katahama, Hisashi, Shiba, YasunariVolume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.33.4843
Date:
September, 1994
File:
PDF, 2.41 MB
1994