Synchrotron White Beam X-Ray Topography Characterization of...

Synchrotron White Beam X-Ray Topography Characterization of Defect Structures in 2,10-Undecanedione/Urea Inclusion Compounds

Chung, Hua, Dudley, Michael, Brown, Michael E., Hollingsworth, Mark D.
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Volume:
276
Language:
english
Journal:
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals
DOI:
10.1080/10587259608039378
Date:
February, 1996
File:
PDF, 590 KB
english, 1996
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