Asymmetric structure-induced hot-electron injection under...

Applied Physics Letters 2013 Vol. 103; Iss. 14

Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor

Tsai, Ming-Yen, Chang, Ting-Chang, Chu, Ann-Kuo, Chen, Te-Chih, Hsieh, Tien-Yu, Lin, Kun-Yao, Tsai, Wu-Wei, Chiang, Wen-Jen, Yan, Jing-Yi
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Volume:
103
Year:
2013
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4824329
File:
PDF, 1.56 MB
english, 2013
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