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Analysis of Threading Dislocations in Wide-Bandgap Hexagonal Semiconductors by Energetic Approach
Semennikov, A.K., Karpov, S.Yu., Ramm, M.S., Romanov, A.E., Makarov, Yuri N.Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.457-460.383
File:
PDF, 450 KB
english, 2004