Investigation of radiation damage in silicon by a...

Radiation Effects 1975 / 01 Vol. 25; Iss. 1

Investigation of radiation damage in silicon by a backscattering method

Götz, Gerhard, Hehl, Karl, Schwabe, Friedhelm, Glaser, Ernst
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Volume:
25
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337577508242050
Date:
January, 1975
File:
PDF, 417 KB
english, 1975
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