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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Research on experiments and the FDTD method of multi-conductor transmission lines for transient analysis
Tiebing Lu,, Lei Qi,, Lin Guo,, Xiang Cui,, Xuesong Gu,Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/ISEMC.2004.1349887
File:
PDF, 241 KB
english, 2004