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Stress-Induced Raman Frequency Shift in $\bf CuInSe_{2}$ Thin Films Prepared by Laser Ablation
Taguchi, Isao, Ezumi, Hiromichi, SusumuKeitoku,, Tamaru, Takeyoshi, HirotoOsono,Volume:
34
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.34.L135
Date:
January, 1995
File:
PDF, 503 KB
1995