IN-SITU TEM INVESTIGATION ON NUCLEATION AND GROWTH BEHAVIOR OF P-DOPED Si THIN FILMS
KIM, KYOU-HYUN, SEO, JONG-HYUN, YOON, SANG-WON, LEE, KON-BAE, WHANG, JIN-HA, AHN, JAE-PYOUNGVolume:
23
Language:
english
Journal:
Modern Physics Letters B
DOI:
10.1142/S0217984909021788
Date:
December, 2009
File:
PDF, 566 KB
english, 2009