THERMAL CHARACTERIZATION OF GaAsN THIN FILMS BY PULSED...

International Journal of Nanoscience 2004 / 12 Vol. 3; Iss. 6

THERMAL CHARACTERIZATION OF GaAsN THIN FILMS BY PULSED PHOTOTHERMAL REFLECTANCE TECHNIQUE

ZHAO, YIMIN, CHEN, GEORGE, WANG, SHANZHONG, YOON, SOON FATT
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Volume:
3
Language:
english
Journal:
International Journal of Nanoscience
DOI:
10.1142/S0219581X0400267X
Date:
December, 2004
File:
PDF, 182 KB
english, 2004
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