Breakdown mechanisms in PZT thin film capacitors

Breakdown mechanisms in PZT thin film capacitors

Yoo, In Kyeong, Kim, Chang Jung, Desu, Seshu B.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
11
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589508013598
Date:
November, 1995
File:
PDF, 419 KB
english, 1995
Conversion to is in progress
Conversion to is failed