Measurement of Semiconductor Heterojunction Band Discontinuities Using Free Electron Laser
Nishi, Kazuhisa, Ohyama, Hideaki, Suzuki, Toshiji, Mitsuyu, Tsuneo, Tomimasu, TakioVolume:
36
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.36.1795
Date:
March, 1997
File:
PDF, 691 KB
1997