Spiral Tunneling Cracks Induced by Environmental Stress...

Spiral Tunneling Cracks Induced by Environmental Stress Cracking in LaRC™-TPI Adhesives

Dillard, David A., Hinkley, Jeffrey A., Johnson, W. Steven, Clair, Terry L. St.
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Volume:
44
Language:
english
Journal:
The Journal of Adhesion
DOI:
10.1080/00218469408026616
Date:
January, 1994
File:
PDF, 2.97 MB
english, 1994
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