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[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Growth and scaling of oxide conduction after breakdown
Linder, B.P., Stathis, J.H., Frank, D.J., Lombardo, S., Vayshenker, A.Year:
2003
Language:
english
DOI:
10.1109/relphy.2003.1197781
File:
PDF, 299 KB
english, 2003