[IEEE International Reliability Physics Symposium - Dallas,...

  • Main
  • [IEEE International Reliability Physics...

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Growth and scaling of oxide conduction after breakdown

Linder, B.P., Stathis, J.H., Frank, D.J., Lombardo, S., Vayshenker, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2003
Language:
english
DOI:
10.1109/relphy.2003.1197781
File:
PDF, 299 KB
english, 2003
Conversion to is in progress
Conversion to is failed