The new Stockholm Electron Beam Ion Trap (S-EBIT)

Journal of Instrumentation 2010 / 12 Vol. 5; Iss. 12

The new Stockholm Electron Beam Ion Trap (S-EBIT)

Schuch, R, Tashenov, S, Orban, I, Hobein, M, Mahmood, S, Kamalou, O, Akram, N, Safdar, A, Skog, P, Solders, A, Zhang, H
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Volume:
5
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/5/12/C12018
Date:
December, 2010
File:
PDF, 7.73 MB
english, 2010
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