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MODELING THE OVERSHOOTING EFFECT OF MULTI-INPUT GATE IN NANOMETER TECHNOLOGIES
DING, LI, HUANG, ZHANGCAI, JIANG, MINGLU, KUROKAWA, ATSUSHI, INOUE, YASUAKIVolume:
21
Language:
english
Journal:
Journal of Circuits, Systems and Computers
DOI:
10.1142/S0218126612400129
Date:
October, 2012
File:
PDF, 324 KB
english, 2012