THE EFFECT OF a-SiN:H AND a-Si:H SURFACE ROUGHNESS OF TFT BY PE/RACVD
KIM, JIN-EUI, RYU, SANG-HYUK, CHOI, SIE-YOUNGVolume:
24
Language:
english
Journal:
International Journal of Modern Physics B
DOI:
10.1142/S0217979210066161
Date:
June, 2010
File:
PDF, 315 KB
english, 2010