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Engineering of nanoscale defect patterns in CeO 2 nanorods via ex situ and in situ annealing
Sakthivel, Tamil Selvan, Reid, David L., Bhatta, Umananda M., Möbus, Günter, Sayle, Dean C., Seal, SudiptaVolume:
7
Year:
2015
Language:
english
Journal:
Nanoscale
DOI:
10.1039/C4NR07308H
File:
PDF, 1.47 MB
english, 2015