Cross-Sectional Potential Imaging of Compound Semiconductor...

Japanese Journal of Applied Physics 1998 / 3 Vol. 37; Iss. Part 1, No

Cross-Sectional Potential Imaging of Compound Semiconductor Heterostructure by Kelvin Probe Force Microscopy

Usunami, Takao, Arakawa, Masashi, Kishimoto, Shigeru, Mizutani, Takashi, Kagawa, Toshiaki, Iwamura, Hidetoshi
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Volume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.37.1522
Date:
March, 1998
File:
PDF, 1.17 MB
1998
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