Characterization of the Refractive Index of Strained...

Japanese Journal of Applied Physics 1998 / 3 Vol. 37; Iss. Part 1, No

Characterization of the Refractive Index of Strained GaInNAs Layers by Spectroscopic Ellipsometry

Kitatani, Takeshi, Kondow, Masahiko, Shinoda, Kazunori, Yazawa, Yoshiaki, Okai, Makoto
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Volume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.753
Date:
March, 1998
File:
PDF, 756 KB
1998
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