Resistive switching characteristics and mechanism of...

Resistive switching characteristics and mechanism of thermally grown WOx thin films

K. P. Biju, X. Liu, M. Siddik, S. Kim, J. Shin, I. Kim, A. Ignatiev, H. Hwang
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Volume:
110
Year:
2011
Language:
english
DOI:
10.1063/1.3633227
File:
PDF, 1.92 MB
english, 2011
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