[IEEE 2014 20th International Workshop on Thermal...

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[IEEE 2014 20th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Greenwich, London, United Kingdom (2014.9.24-2014.9.26)] 20th International Workshop on Thermal Investigations of ICs and Systems - Detection of solder joint cracking of high power leds on AI-IMS during temperature shock test by transient thermal analysis

Elger, Gordon, Kandaswamy, Shri Vishnu, Derix, Robert, Conti, Fosca
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Year:
2014
Language:
english
DOI:
10.1109/therminic.2014.6972530
File:
PDF, 1.39 MB
english, 2014
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