Numerical characterization of local electrical breakdown in...

Numerical characterization of local electrical breakdown in sub-micrometer metallized film capacitors

Jiang, Wei, Zhang, Ya, Bogaerts, Annemie
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
16
Language:
english
Journal:
New Journal of Physics
DOI:
10.1088/1367-2630/16/11/113036
Date:
November, 2014
File:
PDF, 594 KB
english, 2014
Conversion to is in progress
Conversion to is failed