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Numerical characterization of local electrical breakdown in sub-micrometer metallized film capacitors
Jiang, Wei, Zhang, Ya, Bogaerts, AnnemieVolume:
16
Language:
english
Journal:
New Journal of Physics
DOI:
10.1088/1367-2630/16/11/113036
Date:
November, 2014
File:
PDF, 594 KB
english, 2014