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STATISTICAL SIMULATIONS OF THE LOW-FREQUENCY NOISE IN POLYSILICON EMITTER BIPOLAR TRANSISTORS USING A MODEL BASED ON GENERATION-RECOMBINATION CENTERS
SANDÉN, MARTIN, ÖSTLING, MIKAEL, MARINOV, OGNIAN, DEEN, M. JAMALVolume:
1
Language:
english
Journal:
Fluctuation and Noise Letters
DOI:
10.1142/S0219477501000202
Date:
June, 2001
File:
PDF, 266 KB
english, 2001